FP法を活用した蛍光X線式膜厚計による表面分析(小特集分析機器の最前線)

Journal name: 表面技術 = Journal of the Surface Finishing Society of Japan 72(3):2021.3

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Material Type: 記事
Title: FP法を活用した蛍光X線式膜厚計による表面分析
Author/Editor: 阿部海
Series Title: 小特集分析機器の最前線
Author Heading: 阿部海
Alternative Title: Surface Analysis by ED-XRF Coating Thickness Gauge with Activating FP Method
Periodical title: 表面技術 = Journal of the Surface Finishing Society of Japan
No. or year of volume/issue: 72(3):2021.3
Volume: 72
Issue: 3
Pages: 159-161
Publication date of volume/issue (W3CDTF): 2021-03
ISSN (Periodical Title): 0915-1869
ISSN-L (Periodical Title): 0915-1869
Publication (Periodical Title): 東京 : 表面技術協会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: ED-XRF
Coating Thickness
FP Method
NDLC: ZP41
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z17-291
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 031336208
http://id.ndl.go.jp/bib/031336208
Bibliographic Record Category (NDL): 632