薄膜有機トランジスタ用ゲート絶縁層の機械的負荷下での絶縁性能評価

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Material Type: 記事
Title: 薄膜有機トランジスタ用ゲート絶縁層の機械的負荷下での絶縁性能評価
Author/Editor: 日髙功二
小金丸正明
関根智仁
宍戸信之
神谷庄司
三成剛生
池田徹
時任静士
Author Heading: 日髙功二
小金丸正明
関根智仁
宍戸信之
神谷庄司
三成剛生
池田徹
時任静士
Alternative Title: Evaluation of Insulation Capability of Gate-Insulating Layer for Organic Thin-Film Transistors Under Mechanical Loading
Periodical title: マイクロエレクトロニクスシンポジウム論文集
No. or year of volume/issue: 30:2020.9.17・18
Volume: 30
Pages: 95-98
Publication date of volume/issue (W3CDTF): 2020-09
Publication (Periodical Title): 東京 : エレクトロニクス実装学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-1617
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 031963037
http://id.ndl.go.jp/bib/031963037
Bibliographic Record Category (NDL): 632