光コム干渉法を用いた三次元測定技術と産業応用 (特集光コムの基礎から応用まで)

光コム干渉法を用いた三次元測定技術と産業応用

(特集光コムの基礎から応用まで)

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Material Type: 記事
Title: 光コム干渉法を用いた三次元測定技術と産業応用
Author/Editor: 森本康友
今井一宏
興梠元伸
Series Title: 特集光コムの基礎から応用まで
Author Heading: 森本康友
今井一宏
興梠元伸
Periodical title: 次世代センサ = Sensor / 調査委員会編
No. or year of volume/issue: 32(1):2022.7
Volume: 32
Issue: 1
Pages: 10-13
Publication date of volume/issue (W3CDTF): 2022-07
ISSN (Periodical Title): 2188-496X
ISSN-L (Periodical Title): 2188-496X
Publication (Periodical Title): 東京 : 次世代センサ協議会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM15
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-B231
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 032286724
http://id.ndl.go.jp/bib/032286724
Bibliographic Record Category (NDL): 632