X線回折を用いた簡便な転位解析法 (特集溶射皮膜の特性を知るための測定・観察・解析手法)

X線回折を用いた簡便な転位解析法

(特集溶射皮膜の特性を知るための測定・観察・解析手法)

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Material Type: 記事
Title: X線回折を用いた簡便な転位解析法
Author/Editor: 髙木節雄
Series Title: 特集溶射皮膜の特性を知るための測定・観察・解析手法
Author Heading: 髙木節雄
Alternative Title: Easy Dislocation Analysis by Means of X-Ray Diffraction
Periodical title: 溶射 : 日本溶射学会誌
No. or year of volume/issue: 61(3)=194:2024.7
Volume: 61
Issue: 3
Sequential issue number: 194
Pages: 129-135
Publication date of volume/issue (W3CDTF): 2024-07
ISSN (Periodical Title): 0916-6076
ISSN-L (Periodical Title): 0916-6076
Publication (Periodical Title): 東大阪 : 日本溶射学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: X-ray diffraction
Full width at half maximum
Modified Williamson-Hall method
Dislocation density
Micro-strain
NDLC: ZP41
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z17-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 033661001
http://id.ndl.go.jp/bib/033661001
Bibliographic Record Category (NDL): 632