雑誌電子情報通信学会技術研究報告 : 信学技報
Volume number109(291)-109(301):2009.11.19-2009.11.27
Article高速InP HBTに...

高速InP HBTにおけるエミッタ電極の長期通電での劣化現象と高耐熱金属導入による高信頼化 (信頼性)

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高速InP HBTにおけるエミッタ電極の長期通電での劣化現象と高耐熱金属導入による高信頼化

(信頼性)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
10477523
Material type
記事
Author
深井 佳乃ほか
Publisher
東京 : 電子情報通信学会
Publication date
2009-11-20
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 109(294) 2009.11.20
Publication Page
p.11～16
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Paper

Material Type
記事
Title
高速InP HBTにおけるエミッタ電極の長期通電での劣化現象と高耐熱金属導入による高信頼化
Author/Editor
深井 佳乃
栗島 賢二
柏尾 典秀 他
Series Title
信頼性
Author Heading
深井 佳乃
栗島 賢二
柏尾 典秀
Alternative Title
Emitter-metal-related degradation in InP-based HBTs and its suppression by introducing refractory metal
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
109(294) 2009.11.20
Volume
109
Issue
294