Si細線光導波路の曲がり損失の数値解析 (有機エレクトロニクス)

Si細線光導波路の曲がり損失の数値解析

(有機エレクトロニクス)

Journal name: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 109(283) 2009.11.13

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Material Type: 記事
Title: Si細線光導波路の曲がり損失の数値解析
Author/Editor: 外間洋平
北智洋
大寺康夫他
Series Title: 有機エレクトロニクス
Author Heading: 外間洋平
北智洋
大寺康夫
Alternative Title: Numerical analysis of bending loss for Si photonic-wire waveguides
Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue: 109(283) 2009.11.13
Volume: 109
Issue: 283
Pages: 49～54
Publication date of volume/issue (W3CDTF): 2009-11-13
ISSN (Periodical Title): 0913-5685
ISSN-L (Periodical Title): 0913-5685
Publication (Periodical Title): 東京 : 電子情報通信学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: Si細線光導波路
FDTD法
曲がり光導波路
曲げ損失
Si-photonic wire waveguide
Bending loss
FDTD calculation
NDLC: ZN33
Target Audience: 一般
Report No. (Article): OME2009-62
Holding library: 国立国会図書館
Call No.: Z16-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 10477660
http://id.ndl.go.jp/bib/10477660
Bibliographic Record Category (NDL): 632