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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 陳 贇細川 利典吉村 正義
- Series Title
- Alternative Title
- A test pattern matching method on BAST architecture using don't care identification for the detection of random pattern resistant faults
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 110(106) 2010.6.25
- Volume
- 110
- Issue
- 106