Holdings of Libraries in Japan
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CiNii Research
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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 武田 英次
- Author Heading
- Alternative Title
- High field effects and device structures in scaled MOSFETs: reliability physics
- Periodical title
- 応用物理
- No. or year of volume/issue
- 79(7) 2010.7
- Volume
- 79
- Issue
- 7
- Pages
- 642～645