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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 小林 春夫山口 隆弘
- Series Title
- Alternative Title
- Digitally-assisted analog test technology: analog circuit test technology in nano-CMOS era
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 110(140) 2010.7.22・23
- Volume
- 110
- Issue
- 140