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ハンマリング加振機構による電気接点の劣化現象--加振機構のモデリング(9) (光エレクトロニクス)

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ハンマリング加振機構による電気接点の劣化現象--加振機構のモデリング(9)

(光エレクトロニクス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
10817226
Material type
記事
Author
和田 真一ほか
Publisher
東京 : 電子情報通信学会
Publication date
2010-08
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 110(180) 2010.8.26・27
Publication Page
p.1~6
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Paper

Material Type
記事
Author/Editor
和田 真一
越田 圭治
Saindaa Norovlin 他
Alternative Title
Degradation phenomenon of electrical contacts by hammering oscillating mechanism: modeling of the oscillating mechanism (9)
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
110(180) 2010.8.26・27
Volume
110
Issue
180