測定時の劣化の影響を除去した高速NBTI回復特性センサーの検討 (集積回路)

測定時の劣化の影響を除去した高速NBTI回復特性センサーの検討

(集積回路)

Journal name: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 110(344) 2010.12.16・17

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Material Type: 記事
Title: 測定時の劣化の影響を除去した高速NBTI回復特性センサーの検討
Author/Editor: 松本高士
牧野紘明
小林和淑他
Series Title: 集積回路
Author Heading: 松本高士
牧野紘明
小林和淑
Alternative Title: A 65nm CMOS high-speed and high-fidelity NBTI recovery sensor
Periodical title: 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue: 110(344) 2010.12.16・17
Volume: 110
Issue: 344
Pages: 55～58
Publication date of volume/issue (W3CDTF): 2010-12
ISSN (Periodical Title): 0913-5685
ISSN-L (Periodical Title): 0913-5685
Publication (Periodical Title): 東京 : 電子情報通信学会
Place of Publication (Country Code): JP
Text Language Code: jpn
Subject Heading: dependable VLSI
CMOS
NBTI
NDLC: ZN33
Target Audience: 一般
Report No. (Article): ICD2010-104
Holding library: 国立国会図書館
Call No.: Z16-940
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 10936937
http://id.ndl.go.jp/bib/10936937
Bibliographic Record Category (NDL): 632