TEM characterisation of silicide phase formation in Ni-based ohmic contacts to 4H n-SiC (Special issue on new trends for micro- and nano analyses by transmission electron microscopy)
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- Material Type
- 記事
- Author/Editor
- Marek WzorekAndrzej CzerwinskiAndrian Kuchuk 他
- Series Title
- Author Heading
- Periodical title
- Materials transactions
- No. or year of volume/issue
- 52(3) 2011.3
- Volume
- 52
- Issue
- 3
- Pages
- 315～318