Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 鬼頭 信貴高木 一義高木 直史
- Series Title
- Alternative Title
- Modeling of timing faults and test generation for single flux quantum logic circuits
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 110(473) 2011.3.18・19
- Volume
- 110
- Issue
- 473