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雑誌電子情報通信学会技術研究報告 : 信学技報
Volume number110(463) 2011.3.8
Article蛍光測定によるポリフ...

蛍光測定によるポリフルオレン薄膜の光劣化過程の観察--残留酸素の影響 (有機エレクトロニクス)

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蛍光測定によるポリフルオレン薄膜の光劣化過程の観察--残留酸素の影響

(有機エレクトロニクス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
11046150
Material type
記事
Author
中川 将紀ほか
Publisher
東京 : 電子情報通信学会
Publication date
2011-03-08
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 110(463) 2011.3.8
Publication Page
p.17～20
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Paper

Material Type
記事
Title
蛍光測定によるポリフルオレン薄膜の光劣化過程の観察--残留酸素の影響
Author/Editor
中川 将紀
小林 隆史
永瀬 隆 他
Series Title
有機エレクトロニクス
Author Heading
中川 将紀
小林 隆史
永瀬 隆
Alternative Title
Photodegradation dynamics of polyfluorene thin films studied by means of photoluminescence spectroscopy: influence of residual oxygen
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
110(463) 2011.3.8
Volume
110
Issue
463