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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 記事
- Author/Editor
- 志岐 卓信高島 康裕中村 祐一
- Series Title
- Alternative Title
- Delay analysis of sub-path on fabricated chips by several path-delay tests
- Periodical title
- 電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
- No. or year of volume/issue
- 110(432) 2011.3.2-4
- Volume
- 110
- Issue
- 432