Characteristics and the model of resistive random access memory switching of the Ti/TiO2 resistive material depending on the thickness of Ti (Special issue: Solid state devices and materials)

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Characteristics and the model of resistive random access memory switching of the Ti/TiO2 resistive material depending on the thickness of Ti

(Special issue: Solid state devices and materials)

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
11076323
Material type
記事
Author
Sook Joo Kimほか
Publisher
Tokyo : The Japan Society of Applied Physics
Publication date
2011-04
Material Format
Paper
Journal name
Japanese journal of applied physics : JJAP 50(4) (2) 2011.4
Publication Page
p.04DD14-1~4
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Paper

Material Type
記事
Author/Editor
Sook Joo Kim
Min Gyu Sung
Moon Sig Joo 他
Periodical title
Japanese journal of applied physics : JJAP
No. or year of volume/issue
50(4) (2) 2011.4
Volume
50
Issue
4
Other Volume
2