MOS界面準位の測定法(半導体表面・界面状態の測定(技術ノート))

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Material Type: 記事
Title: MOS界面準位の測定法
Author/Editor: 生駒俊明
勝部昭明
Series Title: 半導体表面・界面状態の測定(技術ノート)
Author Heading: 生駒俊明
勝部昭明
Periodical title: 応用物理
No. or year of volume/issue: 48(7) 1979.07
Volume: 48
Issue: 7
Pages: p635～636
Publication date of volume/issue (W3CDTF): 1979-07
ISSN (Periodical Title): 0369-8009
ISSN-L (Periodical Title): 0369-8009
Publication (Periodical Title): 東京 : 応用物理学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM17
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z15-243
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 2056678
http://id.ndl.go.jp/bib/2056678
Bibliographic Record Category (NDL): 632