2次イオン質量分析法における低エネルギーイオン照射下2次イオン放出挙動に関する基礎的検討

Call No. (NDL): Z17-213
Bibliographic ID of National Diet Library: 3156117

Material type: 記事

Author: 小池俊明他

Publisher: 東京 : 日本質量分析学会

Publication date: 1987-10

Material Format: Digital

Journal name: 質量分析 35(5) 1987.10

Publication Page: p.p226～230

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Summary, etc.：: The sputtering behavior of secondary ion from copper surface against primary ion energy less than 3 keV has been studied. A remarked increase of relat...

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Material Type: 記事
Title: 2次イオン質量分析法における低エネルギーイオン照射下2次イオン放出挙動に関する基礎的検討
Author/Editor: 小池俊明他
Author Heading: 小池俊明
Periodical title: 質量分析
No. or year of volume/issue: 35(5) 1987.10
Volume: 35
Issue: 5
Pages: p226～230
Publication date of volume/issue (W3CDTF): 1987-10
ISSN (Periodical Title): 0542-8645
ISSN-L (Periodical Title): 0542-8645
Publication (Periodical Title): 東京 : 日本質量分析学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZP4
Target Audience: 一般
Article Type: 記事分類: 化学・化学工業--化学実験・分析化学--光分析・電磁気分析
Collection: 障害者向け資料
Collection (Materials For Handicapped People:1): テキストデータ
Collection (Materials For Handicapped People:2): プレーンテキスト
Collection (particular): 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
https://dl.ndl.go.jp/collections/A00002
Access Restrictions: 国立国会図書館内限定公開
Service for the Digitized Contents Transmission Service: 図書館・個人送信対象外
Availability of remote photoduplication service: 可
Holding library: 国立国会図書館
Call No.: Z17-213
Periodical Title (Persistent ID (NDL)): info:ndljp/pid/2286949
https://dl.ndl.go.jp/pid/2286949
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 3156117
http://id.ndl.go.jp/bib/3156117
Bibliographic Record Category (NDL): 632