Test generation for multiple fault diagnosis in one-dimensional iterative logic arrays

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Material Type: 記事
Title: Test generation for multiple fault diagnosis in one-dimensional iterative logic arrays
Author/Editor: 高橋寛
山本貴之
高松雄三
Author Heading: 高橋寛
山本貴之
高松雄三
Periodical title: 愛媛大学工学部紀要 / 愛媛大学工学部編
No. or year of volume/issue: 12(4) 1993.02
Volume: 12
Issue: 4
Pages: p501～512
Publication date of volume/issue (W3CDTF): 1993-02
ISSN (Periodical Title): 0285-6107
ISSN-L (Periodical Title): 0285-6107
Publication (Periodical Title): 松山 : 愛媛大学工学部
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM2
Target Audience: 一般
Article Type: 記事分類: 電気工学--電子工学--電子回路
Holding library: 国立国会図書館
Call No.: Z14-23
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 3824128
http://id.ndl.go.jp/bib/3824128
Bibliographic Record Category (NDL): 632