発光減衰曲線の解析によるSiO2の微視的構造の乱雑さの評価

Journal name: 電気学会論文誌. A, 基礎・材料・共通部門誌 = IEEJ transactions on fundamentals and materials 116(10) 1996.09

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Material Type: 記事
Title: 発光減衰曲線の解析によるSiO2の微視的構造の乱雑さの評価
Author/Editor: 石井啓介
薛光洙
大木義路他
Author Heading: 石井啓介
薛光洙
大木義路
Periodical title: 電気学会論文誌. A, 基礎・材料・共通部門誌 = IEEJ transactions on fundamentals and materials
No. or year of volume/issue: 116(10) 1996.09
Volume: 116
Issue: 10
Pages: 881～885
Publication date of volume/issue (W3CDTF): 1996-09
ISSN (Periodical Title): 0385-4205
ISSN-L (Periodical Title): 0385-4205
Publication (Periodical Title): 東京 : 電気学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN31
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-793
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4037162
http://id.ndl.go.jp/bib/4037162
Bibliographic Record Category (NDL): 632