動的故障像を用いたロジックLSIの故障箇所特定手法の開発と応用事例 (LSIの評価・解析技術特集 ; ロジックLSIの故障・不良解析技術)
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- Material Type
- 記事
- Author/Editor
- 中村 豊一大金 秀治黒田 英彦 他
- Series Title
- Periodical title
- NEC技報 = NEC technical journal / NECマネジメントパートナー株式会社 編
- No. or year of volume/issue
- 50(6) 1997.07
- Volume
- 50
- Issue
- 6
- Pages
- 16～20,図巻頭1p