Analysis of Side-Wall Structure of Grown-in Twin-Type Octahedral Defects in Czochralski Silicon

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Analysis of Side-Wall Structure of Grown-in Twin-Type Octahedral Defects in Czochralski Silicon

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
4473697
Material type
記事
Author
Takemi Uekiほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
1998-04
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 37(4A) 1998.04
Publication Page
p.1667~1670
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Detailed bibliographic record

Summary, etc.:

We analyzed the side-wall structure of grown-in octahedral defects in Czochralski silicon standard wafers for large-scale integrated circuits. There a...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Takemi Ueki
Manabu Itsumi
Tadao Takeda
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
37(4A) 1998.04
Volume
37
Issue
4A
Pages
1667~1670
Publication date of volume/issue (W3CDTF)
1998-04