Si(111) Surface under Phase Transitions Studied by the Analysis of Inner Layer Strucutres Using Bias-Dependent Scanning Tunneling Microscopy (Special Issue: Scanning Tunneling Microscopy)

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Si(111) Surface under Phase Transitions Studied by the Analysis of Inner Layer Strucutres Using Bias-Dependent Scanning Tunneling Microscopy(Special Issue: Scanning Tunneling Microscopy)

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
4780777
Material type
記事
Author
Koji Miyakeほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
1999-06
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 38(6B) (通号 502) 1999.06
Publication Page
p.3841~3844
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Detailed bibliographic record

Summary, etc.:

In both cases of quenched and HBO<sub>2</sub>-molecule-irradiated Si(111) surfaces, corner holes are observed to exist along the boundaries between 7×...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Koji Miyake
Takashi Kaikoh
Yan Jun Li 他
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
38(6B) (通号 502) 1999.06
Volume
38
Issue
6B
Sequential issue number
502