特集解説原子間力顕微鏡による原子レベルの物性評価と計測 (特集:電子材料ナノメータ領域評価技術)

特集解説原子間力顕微鏡による原子レベルの物性評価と計測

(特集:電子材料ナノメータ領域評価技術)

Journal name: 電気学会論文誌. C, 電子・情報・システム部門誌 = IEEJ transactions on electronics, information and systems 119(10) 1999.10

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

CiNii Research
Search Service
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: 特集解説原子間力顕微鏡による原子レベルの物性評価と計測
Author/Editor: 森田清三
菅原康弘
Series Title: 特集:電子材料ナノメータ領域評価技術
Author Heading: 森田清三
菅原康弘
Periodical title: 電気学会論文誌. C, 電子・情報・システム部門誌 = IEEJ transactions on electronics, information and systems
No. or year of volume/issue: 119(10) 1999.10
Volume: 119
Issue: 10
Pages: 1109～1112
Publication date of volume/issue (W3CDTF): 1999-10
ISSN (Periodical Title): 0385-4221
ISSN-L (Periodical Title): 0385-4221
Publication (Periodical Title): 東京 : 電気学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN31
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z16-795
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4866247
http://id.ndl.go.jp/bib/4866247
Bibliographic Record Category (NDL): 632