信頼性教室半導体デバイスの静電気破壊現象

Journal name: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌 22(1) (通号 101) 2000.01

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Material Type: 記事
Title: 信頼性教室半導体デバイスの静電気破壊現象
Author/Editor: 福田保裕
Author Heading: 福田保裕
Periodical title: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌
No. or year of volume/issue: 22(1) (通号 101) 2000.01
Volume: 22
Issue: 1
Sequential issue number: 101
Pages: 51～59
Publication date of volume/issue (W3CDTF): 2000-01
ISSN (Periodical Title): 0919-2697
ISSN-L (Periodical Title): 0919-2697
Publication (Periodical Title): 東京 : 日本信頼性学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM1
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-2023
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 4975460
http://id.ndl.go.jp/bib/4975460
Bibliographic Record Category (NDL): 632