高濃度炭素ドープGaAs中の水素および炭素関連欠陥による通電劣化

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高濃度炭素ドープGaAs中の水素および炭素関連欠陥による通電劣化

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
5354329
Material type
記事
Author
伏見 浩ほか
Publisher
東京 : 電子情報通信学会
Publication date
2000-03-17
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 99 (通号 712) 2000.03.17
Publication Page
p.13~18
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Paper

Material Type
記事
Author/Editor
伏見 浩
和田 一実
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
99 (通号 712) 2000.03.17
Volume
99
Sequential issue number
712
Pages
13~18
Publication date of volume/issue (W3CDTF)
2000-03-17