Leakage Mechanism of Local Junctions Forming the Main or Tail Mode of Retention Characteristics for Dynamnic Random Access Memories

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Leakage Mechanism of Local Junctions Forming the Main or Tail Mode of Retention Characteristics for Dynamnic Random Access Memories

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
5384333
Material type
記事
Author
Shuichi Uenoほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
2000-04
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 39(4B) (通号 518) 2000.04
Publication Page
p.1963~1968
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Detailed bibliographic record

Summary, etc.:

We have reported the test structure for measuring the leakage characteristics of the local junctions. In this paper, we analyze the measurement result...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Shuichi Ueno
Yasuo Inoue
Masahide Inuishi 他
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
39(4B) (通号 518) 2000.04
Volume
39
Issue
4B
Sequential issue number
518
Pages
1963~1968