半導体製造工程のデータマイニングにおける次元縮約に関する一考察(日本信頼性学会第14回信頼性シンポジウム報文集 ; セッション3 ハードウェア面〔英文〕)

Journal name: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌 23(7) (通号 115) 2001.11

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Material Type: 記事
Title: 半導体製造工程のデータマイニングにおける次元縮約に関する一考察
Author/Editor: 石崎文高
鶴田浩己
椛田和雄他
Series Title: 日本信頼性学会第14回信頼性シンポジウム報文集 ; セッション3 ハードウェア面〔英文〕
Author Heading: 石崎文高
鶴田浩己
椛田和雄
Periodical title: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌
No. or year of volume/issue: 23(7) (通号 115) 2001.11
Volume: 23
Issue: 7
Sequential issue number: 115
Pages: 725～728
Publication date of volume/issue (W3CDTF): 2001-11
ISSN (Periodical Title): 0919-2697
ISSN-L (Periodical Title): 0919-2697
Publication (Periodical Title): 東京 : 日本信頼性学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM1
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-2023
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 5997812
http://id.ndl.go.jp/bib/5997812
Bibliographic Record Category (NDL): 632