Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Retile Thin Film
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- Material Type
- 記事
- Author/Editor
- 鈴木 利昌若林 博孝西 湯二 他
- Alternative Title
- エピタキシャルSnO2ルチル薄膜中の欠陥構造の透過型電子顕微鏡研究
- Periodical title
- 日本セラミックス協会学術論文誌 / 日本セラミックス協会 [編]
- No. or year of volume/issue
- 110(1278) 2002.2
- Volume
- 110
- Issue
- 1278
- Pages
- 86～91