解説 Electromigration of Si Adatoms on Si Surface--A key to understanding the step bunching instabilities during sublimation, equilibrium and MBE growth (小特集:結晶成長理論の最近の動向)
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- Material Type
- 記事
- Author/Editor
- S. StoyanovJ.J. MetoisV. Tonchev
- Series Title
- Author Heading
- Periodical title
- 日本結晶成長学会誌 = Journal of the Japanese Association for Crystal Growth
- No. or year of volume/issue
- 29(1) 2002
- Volume
- 29
- Issue
- 1
- Pages
- 17~19