F2レーザ用光学薄膜の吸収率・散乱率測定機 (特集:真空紫外領域の計測技術)

F2レーザ用光学薄膜の吸収率・散乱率測定機

(特集:真空紫外領域の計測技術)

Journal name: 光技術コンタクト = Optical and electro-optical engineering contact 40(4) (通号 461) 2002.4

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Material Type: 記事
Title: F2レーザ用光学薄膜の吸収率・散乱率測定機
Author/Editor: 松本明
大内千種
斉藤忠彦
Series Title: 特集:真空紫外領域の計測技術
Author Heading: 松本明
大内千種
斉藤忠彦
Periodical title: 光技術コンタクト = Optical and electro-optical engineering contact
No. or year of volume/issue: 40(4) (通号 461) 2002.4
Volume: 40
Issue: 4
Sequential issue number: 461
Pages: 210～218
Publication date of volume/issue (W3CDTF): 2002-04
ISSN (Periodical Title): 0913-7289
ISSN-L (Periodical Title): 0913-7289
Publication (Periodical Title): 東久留米 : 光学工業技術協会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM35
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z15-362
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 6149829
http://id.ndl.go.jp/bib/6149829
Bibliographic Record Category (NDL): 632