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雑誌Journal of electron microscopy
Volume number51(-) (Suppl.) 2002
ArticleFirst appl...

First application of a spherical-aberration corrected transmission electron microscope in materials science (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

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First application of a spherical-aberration corrected transmission electron microscope in materials science

(Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

Call No. (NDL)
Z53-T76
Bibliographic ID of National Diet Library
6262960
Material type
記事
Author
Bernd Kabiusほか
Publisher
Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press
Publication date
2002
Material Format
Paper
Journal name
Journal of electron microscopy 51(-) (Suppl.) 2002
Publication Page
p.S51～58
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Paper

Material Type
記事
Title
First application of a spherical-aberration corrected transmission electron microscope in materials science
Author/Editor
Bernd Kabius
Max Haider
Stefan Uhlemann 他
Series Title
Eighth Conference on Frontiers of Electron Microscopy in Materials Science
Author Heading
Bernd Kabius
Max Haider
Stefan Uhlemann
Periodical title
Journal of electron microscopy
No. or year of volume/issue
51(-) (Suppl.) 2002
Volume
51
Issue
-
Other Volume
Suppl