Sn-3.0Ag-0.5Cuはんだ接合部における相成長による熱疲労き裂発生評価

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Sn-3.0Ag-0.5Cuはんだ接合部における相成長による熱疲労き裂発生評価

Call No. (NDL)
Z16-1617
Bibliographic ID of National Diet Library
6344814
Material type
記事
Author
佐山 利彦ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2002-10
Material Format
Paper
Journal name
マイクロエレクトロニクスシンポジウム論文集 12 2002.10.8・9
Publication Page
p.119~122
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Paper

Material Type
記事
Author/Editor
佐山 利彦
山崎 聡子
長井 喜昭 他
Periodical title
マイクロエレクトロニクスシンポジウム論文集
No. or year of volume/issue
12 2002.10.8・9
Volume
12
Pages
119~122
Publication date of volume/issue (W3CDTF)
2002-10
Publication (Periodical Title)
東京 : エレクトロニクス実装学会