雑誌エレクトロニクス実装学会誌
Volume number6(1) (通号 35)-6(7) (通号 41) 20030100-20031100
ArticleCMOS論理ICの交...

CMOS論理ICの交流電界印加時の電源電流測定によるピン浮き検出法

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CMOS論理ICの交流電界印加時の電源電流測定によるピン浮き検出法

Call No. (NDL)
Z74-B258
Bibliographic ID of National Diet Library
6483876
Material type
記事
Author
一宮 正博ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2003-03
Material Format
Paper
Journal name
エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging 6(2) (通号 36) 2003.3
Publication Page
p.140～146
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Paper

Material Type
記事
Title
CMOS論理ICの交流電界印加時の電源電流測定によるピン浮き検出法
Author/Editor
一宮 正博
橋爪 正樹
四柳 浩之 他
Author Heading
一宮 正博
橋爪 正樹
四柳 浩之
Periodical title
エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging
No. or year of volume/issue
6(2) (通号 36) 2003.3
Volume
6
Issue
2
Sequential issue number
36
Pages
140～146