透過型電子顕微鏡による原子観察と格子欠陥計測(特集マイクロビジュアリゼーション)

Journal name: 可視化情報学会誌 = Journal of the Visualization Society of Japan 23(90) 2003.7

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Material Type: 記事
Title: 透過型電子顕微鏡による原子観察と格子欠陥計測
Author/Editor: 阿部弘亨
Series Title: 特集マイクロビジュアリゼーション
Author Heading: 阿部弘亨
Periodical title: 可視化情報学会誌 = Journal of the Visualization Society of Japan
No. or year of volume/issue: 23(90) 2003.7
Volume: 23
Issue: 90
Pages: 145～150,図巻頭1p
Publication date of volume/issue (W3CDTF): 2003-07
ISSN (Periodical Title): 0916-4731
ISSN-L (Periodical Title): 0916-4731
Publication (Periodical Title): 東京 : 可視化情報学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM35
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z15-431
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 6633323
http://id.ndl.go.jp/bib/6633323
Bibliographic Record Category (NDL): 632