Improvement of Oxidation-Induced Ge Condensation Method by H〔+〕 Implantation and Two-Step Annealing for Highly Stress-Relaxed SiGe-on-Insulator (Special Issue: Solid State Devices & Materials)

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Improvement of Oxidation-Induced Ge Condensation Method by H〔+〕 Implantation and Two-Step Annealing for Highly Stress-Relaxed SiGe-on-Insulator(Special Issue: Solid State Devices & Materials)

Call No. (NDL)
Z53-A375
Bibliographic ID of National Diet Library
7306377
Material type
記事
Author
Taizoh Sadohほか
Publisher
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Publication date
2005-04
Material Format
Digital
Journal name
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 44(4B) (通号 611) (Special Issue) 2005.4
Publication Page
p.2357~2360
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Detailed bibliographic record

Summary, etc.:

The effects of the H<SUP>+</SUP> implantation (8.1 keV and 0–5×10<SUP>16</SUP> cm<SUP>−2</SUP>) and two-step annealing (1st: 500°C for 30 min, 2nd: 85...

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Bibliographic Record

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Digital

Material Type
記事
Author/Editor
Taizoh Sadoh
Ryo Matsuura
Masaharu Ninomiya 他
Periodical title
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
No. or year of volume/issue
44(4B) (通号 611) (Special Issue) 2005.4
Volume
44
Issue
4B
Sequential issue number
611