DLTS法によるSiCショットキダイオードの電子トラップの評価

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Material Type: 記事
Title: DLTS法によるSiCショットキダイオードの電子トラップの評価
Author/Editor: 中嶋紘治
徳田豊
Author Heading: 中嶋紘治
徳田豊
Periodical title: 愛知工業大学研究報告. B, 専門関係論文集
No. or year of volume/issue: (40B) 2005.3
Issue: 40B
Pages: 19～24
Publication date of volume/issue (W3CDTF): 2005-03
ISSN (Periodical Title): 0387-0812
ISSN-L (Periodical Title): 0387-0812
Publication (Periodical Title): 豊田 : 愛知工業大学
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM2
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-355
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 7804901
http://id.ndl.go.jp/bib/7804901
Bibliographic Record Category (NDL): 632