薄膜の結晶構造解析技...

薄膜の結晶構造解析技術--In-Plane X線回折法および電子線後方散乱回折像 (特集 解析・評価技術)

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薄膜の結晶構造解析技術--In-Plane X線回折法および電子線後方散乱回折像

(特集 解析・評価技術)

Call No. (NDL)
Z16-245
Bibliographic ID of National Diet Library
8881257
Material type
記事
Author
鈴木 克紀ほか
Publisher
東京 : 富士電機技術開発本部 ; [1935]-2012
Publication date
2007-05
Material Format
Paper
Journal name
富士時報 = Fuji electric journal 80(3) (通号 844) 2007.5
Publication Page
p.186~190
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Paper

Material Type
記事
Author/Editor
鈴木 克紀
大山 浩永
佐々木 弘次
Alternative Title
Crystal structure analysis of thin film: grazing incidence in-plane X-ray diffraction and electron backscattering diffraction profile
Periodical title
富士時報 = Fuji electric journal
No. or year of volume/issue
80(3) (通号 844) 2007.5
Volume
80
Issue
3