同時R/W課題への耐性を有する階層型レプリカビット線技術を用いた45nm2ポート 8T-SRAM (シリコン材料・デバイス)

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同時R/W課題への耐性を有する階層型レプリカビット線技術を用いた45nm2ポート 8T-SRAM

(シリコン材料・デバイス)

Call No. (NDL)
Z16-940
Bibliographic ID of National Diet Library
8896122
Material type
記事
Author
石倉 聡ほか
Publisher
東京 : 電子情報通信学会
Publication date
2007-08
Material Format
Paper
Journal name
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 107(194) 2007.8.23・24
Publication Page
p.145~148
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Paper

Material Type
記事
Author/Editor
石倉 聡
車田 総希
寺野 登志夫 他
Alternative Title
A 45nm 2port 8T-SRAM using hierarchical replica bitline technique with immunity from simultaneous R/W access issues
Periodical title
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報
No. or year of volume/issue
107(194) 2007.8.23・24
Volume
107
Issue
194