半導体デバイスの信頼性基礎講座(RCJ故障物理研究委員会編)(2)LSIの寿命分布

Journal name: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌 29(5) (通号 161) 2007.8

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Material Type: 記事
Title: 半導体デバイスの信頼性基礎講座(RCJ故障物理研究委員会編)(2)LSIの寿命分布
Author/Editor: 木村忠正
Author Heading: 木村忠正
Alternative Title: Basic course in reliability: Basic course in semiconductor device reliability (2) life distribution of LSI
Periodical title: 信頼性 = The journal of Reliability Engineering Association of Japan : 日本信頼性学会誌
No. or year of volume/issue: 29(5) (通号 161) 2007.8
Volume: 29
Issue: 5
Sequential issue number: 161
Pages: 335～338
Publication date of volume/issue (W3CDTF): 2007-08
ISSN (Periodical Title): 0919-2697
ISSN-L (Periodical Title): 0919-2697
Publication (Periodical Title): 東京 : 日本信頼性学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZM1
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z14-2023
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 8915227
http://id.ndl.go.jp/bib/8915227
Bibliographic Record Category (NDL): 632