MOSFETの負バイアス温度不安定性の微視的メカニズム
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- Material Type
- 記事
- Author/Editor
- 丸泉 琢也牛尾 二郎
- Alternative Title
- Microscopic mechanism of negative bias temperature instability (NBTI) in MOS devices
- Periodical title
- 応用物理
- No. or year of volume/issue
- 77(6) 2008.6
- Volume
- 77
- Issue
- 6
- Pages
- 676～680