飛行時間型二次イオン質量分析法(TOF-SIMS) (特集バイオ計測技術の最新動向)

飛行時間型二次イオン質量分析法(TOF-SIMS)

(特集バイオ計測技術の最新動向)

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Material Type: 記事
Title: 飛行時間型二次イオン質量分析法(TOF-SIMS)
Author/Editor: 青柳里果
Series Title: 特集バイオ計測技術の最新動向
Author Heading: 青柳里果
Periodical title: 化学工学 = Chemical engineering of Japan
No. or year of volume/issue: 72(9) 2008.9
Volume: 72
Issue: 9
Pages: 464～466
Publication date of volume/issue (W3CDTF): 2008-09
ISSN (Periodical Title): 0375-9253
ISSN-L (Periodical Title): 0375-9253
Publication (Periodical Title): 東京 : 化学工学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZP5
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z17-53
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 9633264
http://id.ndl.go.jp/bib/9633264
Bibliographic Record Category (NDL): 632