部品内蔵基板の生産性向上に繋がる解析関連技術(特集エレクトロニクス実装技術の現状と展望)

Journal name: エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging 20(1)=133:2017.1

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

J-STAGE
Digital
J-STAGE
CiNii Research
Search Service
Digital
You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.
Check the holdings of this book

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 記事
Title: 部品内蔵基板の生産性向上に繋がる解析関連技術
Author/Editor: 部品内蔵技術委員会
Series Title: 特集エレクトロニクス実装技術の現状と展望
Author Heading: 部品内蔵技術委員会
Alternative Title: EDA Technology of Challenge for Productivity of Device Embedded Substrate
Periodical title: エレクトロニクス実装学会誌 = Journal of the Japan Institute of Electronics Packaging
No. or year of volume/issue: 20(1)=133:2017.1
Volume: 20
Issue: 1
Sequential issue number: 133
Pages: 57-61
Publication date of volume/issue (W3CDTF): 2017-01
ISSN (Periodical Title): 1343-9677
ISSN-L (Periodical Title): 1343-9677
Publication (Periodical Title): 東京 : エレクトロニクス実装学会
Place of Publication (Country Code): JP
Text Language Code: jpn
NDLC: ZN33
Target Audience: 一般
Holding library: 国立国会図書館
Call No.: Z74-B258
Data Provider (Database): 国立国会図書館 : 国立国会図書館雑誌記事索引
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 027845487
http://id.ndl.go.jp/bib/027845487
Bibliographic Record Category (NDL): 632

DOI: 10.5104/jiep.20.57
https://doi.org/10.5104/jiep.20.57
Related Material (URI): http://id.ndl.go.jp/bib/027845487
https://ndlsearch.ndl.go.jp/books/R000000004-I027845487
https://www.jstage.jst.go.jp/article/jiep/20/1/20_57/_pdf
References: Removing Nuclear Weapons from Turkey
https://cir.nii.ac.jp/crid/1361981468676973952
部品内蔵基板の検査方法の提案
https://cir.nii.ac.jp/crid/1390001204560487296
プリント回路板における検査のあり方と問題
https://cir.nii.ac.jp/crid/1390001204561354624
DfTの実践事例
https://cir.nii.ac.jp/crid/1390282679537550208
システムJisso-CAD/CAEの課題と展望
https://cir.nii.ac.jp/crid/1390282679538102784
Data Provider (Database): 国立情報学研究所 : CiNii Research
https://cir.nii.ac.jp/
Original Data Provider (Database): Japan Link Center
https://japanlinkcenter.org/top
雑誌記事索引データベース
https://ndlsearch.ndl.go.jp
Crossref
https://www.crossref.org
CiNii Articles
Bibliographic ID (NDL): 027845487
http://id.ndl.go.jp/bib/027845487
NAID: 130005530013