Jump to main content

Cu/Ni-P/Sn-5Sb-0.7Cuはんだ接合部エレクトロマイグレーションの電流密度加速性

Icons representing 記事

Cu/Ni-P/Sn-5Sb-0.7Cuはんだ接合部エレクトロマイグレーションの電流密度加速性

Call No. (NDL)
Z16-1617
Bibliographic ID of National Diet Library
033132168
Material type
記事
Author
和田 有史ほか
Publisher
東京 : エレクトロニクス実装学会
Publication date
2022-09
Material Format
Paper
Journal name
マイクロエレクトロニクスシンポジウム論文集 32:2022.9.5-7
Publication Page
p.145-148
View All

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

  • J-STAGE

    Digital
  • CiNii Research

    Search Service
    Digital
    You can check the holdings of institutions and databases with which CiNii Research is linked at the site of CiNii Research.

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper Digital

Material Type
記事
Author/Editor
和田 有史
小黒 航平
長谷川 就大
山中 公博
Alternative Title
Current Density Acceleration of Electromigration on Cu/Ni-P/Sn-5Sb-0.7Cu Solder Joint
Periodical title
マイクロエレクトロニクスシンポジウム論文集
No. or year of volume/issue
32:2022.9.5-7
Volume
32
Pages
145-148
Publication date of volume/issue (W3CDTF)
2022-09