ワイドギャップ半導体（SiCおよびGaN）MOS界面欠陥の電子スピン共鳴分光同定

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Material Type: 文書・図像類
Title: ワイドギャップ半導体（SiCおよびGaN）MOS界面欠陥の電子スピン共鳴分光同定
Author/Editor: 梅田, 享英
Author Heading: 梅田, 享英ウメダ, タカヒデ
Publication Date: 2020
Publication Date (W3CDTF): 2020
Alternative Title: Electron-spin-resonance characterization on interface defects at wide-gap semiconductor (SiC and GaN) MOS interfaces
Text Language Code: jpn
Target Audience: 一般
Note (General): 科学研究費助成事業研究成果報告書：基盤研究(B)2017-2019課題番号 : 17H02781
Access Restrictions: インターネット公開
Related Material (URI): URI
https://kaken.nii.ac.jp/ja/grant/KAKENHI-PROJECT-17H02781/
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 筑波大学 : つくばリポジトリ