金属V溝導波路による超集束効果を用いたテラヘルツ波の高感度EOサンプリング

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Author: 都築, 聡ほか

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Publication date: 2013-08

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Note (General)：: We have succeeded in enhancing the sensitivity of electro-optic (EO) sampling of terahertz (THz) waves using a metallic waveguide structure. The EO sa...

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Material Type: 文書・図像類
Title: 金属V溝導波路による超集束効果を用いたテラヘルツ波の高感度EOサンプリング
Author/Editor: 都築, 聡
竹嶋, 大貴
左近, 知也
木下, 哲也
永瀬, 友大
栗原, 一嘉
山本, 晃司
桑島, 史欣
古屋, 岳
谷, 正彦
Tsuzuki, Satoshi
Takeshima, Daiki
Sakon, Tomoya
Kinoshita, Tetsuya
Nagase, Tomohiro
Kurihara, Kazuyosi
Yamamoto, Kohji
Kuwashima, Fumiyoshi
Furuya, Takashi
Tani, Masahiko
Author Heading: 都築, 聡
竹嶋, 大貴
左近, 知也
木下, 哲也
永瀬, 友大
栗原, 一嘉
山本, 晃司
桑島, 史欣
古屋, 岳
谷, 正彦
Tsuzuki, Satoshi
Takeshima, Daiki
Sakon, Tomoya
Kinoshita, Tetsuya
Nagase, Tomohiro
Kurihara, Kazuyosi
Yamamoto, Kohji
Kuwashima, Fumiyoshi
Furuya, Takashi
Tani, Masahiko
Publication Date: 2013-08
Publication Date (W3CDTF): 2013-08
Alternative Title: Highly Sensitive EO Sampling of Terahertz Wave Using Super-focusing Effect
Periodical title: 遠赤外領域開発研究
No. or year of volume/issue: 14
Volume: 14
Pages: 65-73
Text Language Code: jpn
Target Audience: 一般
Note (General): We have succeeded in enhancing the sensitivity of electro-optic (EO) sampling of terahertz (THz) waves using a metallic waveguide structure. The EO sampling signal increases proportionally to incident THz electric field intensity. Thus, increasing the THz electric field collection efficiency leads to an enhancement in the sampling sensitivity. In this research, we used a tapered parallel plate, V-groove structure waveguide to collect the THz waves into the sub-wavelength gap of a parallel plate waveguide. Furthermore, by using a thin EO crystal (LiNbO3 crystal) attached to the end of the metallic waveguide structure, we have suppressed diffraction effects. As a result, the EO sampling signal was enhanced ～20 times compared to the case without the metallic waveguide structure.
Source: https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=27589&item_no=1&attribute_id=22&file_no=1
https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=27589&item_no=1&attribute_id=22&file_no=1
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 福井大学 : 福井大学学術機関リポジトリ