Application of induced current potential drop technique for measurements of cracks on internal wall of tube-shaped specimens

Material type: 文書・図像類

Author: SATO, Yasumotoほか

Publisher: ASTM - American Society for Testing and Materials

Publication date: 2007-10

Material Format: Digital

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Note (General)：: This paper presents the applicability of induced current potential drop (ICPD) technique to the detection and sizing of defects in objects with a shap...

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Material Type: 文書・図像類
Title: Application of induced current potential drop technique for measurements of cracks on internal wall of tube-shaped specimens
Author/Editor: SATO, Yasumoto
ATSUMI, Takeo
SHOJI, Tetsuo
Author Heading: SATO, Yasumoto
ATSUMI, Takeo
SHOJI, Tetsuo
Publication, Distribution, etc.: ASTM - American Society for Testing and Materials
Publication Date: 2007-10
Publication Date (W3CDTF): 2007-10
Periodical title: Journal of Testing and Evaluation
No. or year of volume/issue: 40 7
Volume: 40
Issue: 7
Pages: 497-504
Text Language Code: eng
Subject Heading: Nondestructive evaluation
Thermal fatigue crack
Tube-shaped specimen
Finite element analysis
Potential drop
Target Audience: 一般
Note (General): This paper presents the applicability of induced current potential drop (ICPD) technique to the detection and sizing of defects in objects with a shape of real components. The shape of tube was selected as one of the shape of real components and an ICPD sensor for the inspection of tube-shaped specimens was developed. The usefulness of the developed sensor was verified by experiments. Finite element analysis (FEA) was conducted to obtain calibration data to convert potential drop (PD) data measured using the sensor into the depth of defects. It was shown that the crack depths estimated based on measured PDs and FEA showed good agreement with the crack depths estimated by ultrasonic testing.
Source: https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=22274&item_no=1&attribute_id=22&file_no=1
https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=22274&item_no=1&attribute_id=22&file_no=1
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 福井大学 : 福井大学学術機関リポジトリ