Resistance associated with measurements of capacitance in electric double layers

Material type: 文書・図像類

Author: Aoki, Koichiほか

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Publication date: 2013-01

Material Format: Digital

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Note (General)：: The behavior of electric double layers at polarized interfaces in KC1 solutions is revisited in order to examine properties of the constant phase elem...

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Material Type: 文書・図像類
Title: Resistance associated with measurements of capacitance in electric double layers
Author/Editor: Aoki, Koichi
Hou, Yongdan
Chen, Jingyuan
Nishiumi, Toyohiko
Author Heading: Aoki, Koichi
Hou, Yongdan
Chen, Jingyuan
Nishiumi, Toyohiko
Publication Date: 2013-01
Publication Date (W3CDTF): 2013-01
Periodical title: Journal of Electroanalytical Chemistry
No. or year of volume/issue: 689
Volume: 689
Pages: 124-129
Text Language Code: eng
Subject Heading: Nyquist plot of ac impedance
constant phase elements
capacitance and resistance of electric double layer
frequency dispersion of capacitance
Target Audience: 一般
Note (General): The behavior of electric double layers at polarized interfaces in KC1 solutions is revisited in order to examine properties of the constant phase element (CPE). We pay attention specifically to frequency dependence of both the capacitance and the resistance. Two parallel platinum wires immersed in solution are used as insulator-free electrodes. They avoid stray capacitance or irreproducibility of impedance caused by incompleteness of electric shield of electrodes. The Nyquist plot takes approximately a straight line because the in-phase component, Z1, is inversely proportional to ac-frequency, similar to the capacitance. Since Zi extrapolated to zero separation of the electrodes is non-zero, a resistance is present at the double layer in parallel form. It is not a Faradaic resistance because of absence of any electroactive species. The parallel resistance is inversely proportional to the frequency, whereas the capacitance decreases with a linear relation to logarithm of the frequency. The latter is responsible for the frequency-dependence of the former. The parallel resistance is the apparent one involved inevitably in ac-measurements of the capacitance. Values of the capacitance are independent of concentration of KC1 in the domain from 0.1 mM to 3 M.
Source: https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=22962&item_no=1&attribute_id=22&file_no=1
https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=22962&item_no=1&attribute_id=22&file_no=1
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 福井大学 : 福井大学学術機関リポジトリ