Quantitative Relation of the Frequency Dispersion of Double Layer Capacitances to Surface Roughness

Material type: 文書・図像類

Author: Koichi, Jeremiah Aokiほか

Publisher: Opast Publishing Group

Publication date: 2018-11-09

Material Format: Digital

Capacity, size, etc.: -

NDC: -

View All

Notes on use

Note (General)：: Frequency dispersion of double layer (DL) capacitances, which can be represented by the power law of the frequency or the constant phase element, is m...

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

Ｕｎｉｖｅｒｓｉｔｙ　ｏｆ　Ｆｕｋｕｉ　Ａｃａｄｅｍｉｃ　Ｒｅｐｏｓｉｔｏｒｙ
Digital
You can check the holdings of institutions and databases with which 学術機関リポジトリデータベース（IRDB）（機関リポジトリ） is linked at the site of 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）.
Ｕｎｉｖｅｒｓｉｔｙ　ｏｆ　Ｆｕｋｕｉ　Ａｃａｄｅｍｉｃ　Ｒｅｐｏｓｉｔｏｒｙ

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Digital

Material Type: 文書・図像類
Title: Quantitative Relation of the Frequency Dispersion of Double Layer Capacitances to Surface Roughness
Author/Editor: Koichi, Jeremiah Aoki
Jingyuan, Chen
Zhaohao, Wang
Author Heading: Koichi, Jeremiah Aoki
Jingyuan, Chen
Zhaohao, Wang
Publication, Distribution, etc.: Opast Publishing Group
Publication Date: 2018-11-09
Publication Date (W3CDTF): 2018-11-09
Periodical title: NANO
No. or year of volume/issue: 1 1
Volume: 1
Issue: 1
Pages: 1-7
ISSN (Periodical Title): ISSN : 2640-5571
Text Language Code: eng
Subject Heading: electrochemical oxidation
frequency dispersion of double layer capacitances
entropy of oriented dipoles
free-energy relationship
surface roughness of highly oriented pyrolytic graphite
Target Audience: 一般
Note (General): Frequency dispersion of double layer (DL) capacitances, which can be represented by the power law of the frequency or the constant phase element, is modeled by the Arrhenius equation with the activation energy which has a linear relation with the free energy change in the orientation of solvent dipoles. The Arrhenius equation has a form of a differential equation of the number of oriented dipoles. The solution is the power law of the time, being equivalent to the DL capacitance with the power law of the frequency. The power number is associated with the surface roughness of the electrode on the assumption that a dipole is oriented with the help of interaction on a given local area of the electrode. Then it has an approximately linear relation with the surface roughness. Surface roughness of highly oriented pyrolytic graphite electrodes is varied unintentionally by peeling-off processes and intentionally by electrochemical oxidation. The power numbers determined by ac-impedance techniques are compared with surface roughness obtained by scanning probe microscopy. They are approximately proportional to the surface roughness factor when the scanned domain on the surface is less than (40 nm)2, which is much smaller than the domain for the fractal structure.
Source: https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=24105&item_no=1&attribute_id=22&file_no=1
https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=24105&item_no=1&attribute_id=22&file_no=1
Access Restrictions: 限定公開
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 福井大学 : 福井大学学術機関リポジトリ