Stripped charge of Ag less than deposited one owing to negative capacitance caused by redox reactions

Material type: 文書・図像類

Author: Koichi, Jeremiah Aokiほか

Publisher: Wiley

Publication date: 2019-07-22

Material Format: Digital

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Note (General)：: Anodic stripping voltammetry was made in AgNO3 solution, here Ag was deposited under long term potentiostatic conditions to evaluate the reduction cha...

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Material Type: 文書・図像類
Title: Stripped charge of Ag less than deposited one owing to negative capacitance caused by redox reactions
Author/Editor: Koichi, Jeremiah Aoki
Jingyuan, Chen
Ru, Wang
Author Heading: Koichi, Jeremiah Aoki
Jingyuan, Chen
Ru, Wang
Publication, Distribution, etc.: Wiley
Publication Date: 2019-07-22
Publication Date (W3CDTF): 2019-07-22
Periodical title: Electroanalysis
No. or year of volume/issue: 31
Volume: 31
Pages: 1-9
ISSN (Periodical Title): ISSN : 1040-0397
ISSN : 1521-4109
Text Language Code: eng
Subject Heading: Anodic stripping voltammetry
negative capacitance
stripped charge of Ag
Target Audience: 一般
Note (General): Anodic stripping voltammetry was made in AgNO3 solution, here Ag was deposited under long term potentiostatic conditions to evaluate the reduction charge, qr, and then was stripped by linear sweep voltammetry to determine the oxidation charge, qo. The charges were unbalanced, satisfying ca. qo=0.7|qr|, where other possible reduction charge such as by dioxygen and dichlorosilver were subtracted. The 30 % loss of the anodic charge can be ascribed to the negative capacitance by the potential sweep generation of Ag+. The generated Ag+ forms a dipole with a counter ion, of which orientation is the same as the direction of the externally applied electric field and opposite to the dipoles of solvent. The redox dipole decreases the conventional double layer capacitance caused by solvent dipoles, and high concentrations of Ag+ takes the capacitance to be negative values. The unbalanced charge, however, has no influence on quantitative determination of concentrations Ag+ by use of a calibration line.
Source: https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=24517&item_no=1&attribute_id=22&file_no=1
https://u-fukui.repo.nii.ac.jp/?action=repository_action_common_download&item_id=24517&item_no=1&attribute_id=22&file_no=1
Access Restrictions: 限定公開
Related Material (DOI): 10.1002/elan.201800873
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 福井大学 : 福井大学学術機関リポジトリ